US 4,055,992 A · Beam lead testing apparatus

Abstract

An apparatus for testing the bond strength of beam leads is disclosed. The present invention involves testing apparatus that includes a movable table having a probe, a mounting bar adjacent said movable table having a base with an angled surface for mounting microcircuit devices having beam leads and a driving assembly that attaches to said mounting bar for rotating said mounting bar. The device chips are mounted on the mounting bar. The table is positioned towards and under the beam leads extending from the device, the probe on the index table is precisely adjusted to clamp the desired beam lead against the table. The driving assembly is activated to move the mounting bar away from the table until the beam lead is stripped therefrom. A force gage which is attached to the driving assembly measures the force required to strip the beam lead away from the device chip.

Claims8

Dependent claims

An apparatus for testing the strength of beam leads bonded to a device comprising:

table means;
clamp means for holding beam leads to said table means;
a mounting bar adjacent said table means and having means for mounting said device;
said table means and said mounting bar being movable relative to each other;
means for rotating said mounting bar such that the beam leads held to said table means are broken from said device;
and
means for measuring the force applied by said means for rotating to cause said beam leads to be broken from said device.

4 more elements

Dependencies are inferred from the claim text.

Beam lead testing apparatus

Life of this patent

Beam lead testing apparatus

Life of this patent

Abstract

Claims8