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US 4,055,805 AGranted
Multi-point test probe
AssigneeProbe-Rite, Inc.
InventorFrank J. Ardezzone
Life of this patent
Estimating the term…
Abstract
A multi-point probe head assembly for providing electro-mechanical interface contact with miniature electronic devices and including a rigid support member, a plurality of probe tips each attached to a probe arm, and adjustment means for adjusting the relative position of each probe tip in three orthogonal planes.
Claims12
A probe head assembly for use in testing miniature electronic devices, and comprising
- an electrically insulating board having a planar first surface, a planar second surface and an aperture formed in a generally central portion thereof;
- a first plurality of electrically conductive contact strips disposed upon at least one of said surfaces and arrayed along an edge of said board to form a board interconnect means;
- a plurality of probe means each including an elongated body disposed upon said first surface and oriented along a radial line extending outwardly from the center of said aperture, said probe means being affixed to said board by pivot means which permit said probe means to be rotated thereabout in the plane of said first surface and to be moved along said radial lines, each of said probe means further including a contact means affixed to the end of said body nearest said aperture;
- a plurality of electrical conductors respectively coupling said probe means to different ones of said first contact strips;
- support means having a form concentric with said aperature attached to said board, said support means having a raised portion having a hollow inverted generally V-shaped cross-section, a circular guide supported by the support means attached in concentric relation to said aperature, said circular guide having means forming a fulcrum above each probe means;
- and
- elongated lever means including a first end portion for insertion within said raised portion and having means for drivably engaging one of said probe means, said lever means further having a mid-portion for engaging said fulcrum and a second end portion forming an elongated handle, whereby said lever means is movable about said fulcrum to cause said probe means to be moved along said radial lines and pivotally about said pivot means to selectively position said contact means beneath said aperture.
4 more elements
A probe head assembly for use in testing miniature electronic devices, and comprising
- an electrically insulating board having a planar first surface, a planar second surface and an aperture formed in a generally central portion thereof;
- a first plurality of electrically conductive contact strips disposed upon at least one of said surfaces and arrayed along an edge of said board to form a board interconnect means;
- a plurality of probe means each including an elongated body disposed upon said first surface and oriented along a radial line extending outwardly from the center of said aperture, said probe means being affixed to said board by pivot means which permit said probe means to be rotated thereabout in the plane of said first surface and to be moved along said radial lines, each of said probe means further including a contact means affixed to the end of said body nearest said aperture, and each of said bodies includng a coupling member for mating with a lever means;
- a plurality of electrical conductors respectively coupling said probe means to different ones of said first contact strips;
- means forming a fulcrum above each probe means, said means forming a fulcrum including a support having an inverted substantially V-shaped cross-section and a circular plate having openings disposed above each said coupling member, said circular plate being supported by said support, and
- elongated lever means including a first end portion having means for drivably engaging one of said probe means, a mid-portion for engaging said fulcrum, and a second end portion forming an elongated handle, said lever means being movable about said fulcrum to cause said probe means to be moved along said radial lines and pivotally about said pivot means to selectively position said contact means beneath said aperture.
3 more elements
Dependencies are inferred from the claim text.