Mass spectrometer with superimposed electric and magnetic fields
AssigneeNihon Denshi Kabushiki Kaisha
InventorMotohiro Naito
Life of this patent
Estimating the term…
Abstract
A mass spectrometer comprising superimposed electric and magnetic fields arranged substantially at right angles. The central orbit of the ion beam produced by an ion source is located on an equipotential surface in the electric field. The ion beam is accelerated by a means for producing a constant accelerating voltage. The electric field is swept by a sweep means. The change of the focal length of the superimposed field when the electric field is swept by said sweep means is compensated by a compensating means, thereby providing a mass spectrometer capable of measuring ions having a wide range of mass to charge ratios and capable of scanning at high speed and having a high accuracy mass marker.
Claims6
In a mass spectrometer comprising an ion source, means for producing a constant accelerating voltage for drawing an ion beam from said source, means for creating superimposed electric and magnetic fields at right angles through which fields the ion beam is passed prior to detection such that the central orbit of the ion beam is substantially located on an equipotential surface of the electric field, the improvement comprising means for sweeping the intensity of the electric field to change the mass to charge ratio of the ions traveling the central ion orbit, and means for simultaneously compensating for the change in the focal length of the superimposed field when the electric field is swept by the sweep means.
In a mass spectrometer comprising an ion source, means for producing a constant accelerating voltage for drawing an ion beam from said source, means for creating superimposed electric and magnetic fields at right angles through which fields the ion beam is passed prior to detection such that the central ion orbit of the ion beam is substantially located on an equipotential surface of the electric field, the improvement comprising means for sweeping the intensity of the electric field to change the mass to charge ratio of the ions traveling the central ion orbit, and first means for simultaneously compensating for the change in the focal length of the superimposed field when the electric field is swept by the sweep means, and second means arranged in tandem with the superimposed fields for correcting the increase in energy dispersion when measuring ions having high m/e ratios.
Dependencies are inferred from the claim text.