Specular reflectance microdensitometer
AssigneeXerox Corporation
InventorJohn C. Witte
Life of this patent
Estimating the term…
Abstract
A specular reflectance microdensitometer including an illuminating microscope and a collecting microscope, disposed on optical axes at equal and opposite angles relative to a reflecting test surface. The illuminating microscope illuminates a known area on the test surface from which light is reflected into the collecting microscope. The objective lens of the collecting microscope images the illuminated test surface on a field lens which in turn images the objective lens on the face of a fiber optic bundle. The light incident on the fiber bundle is transmitted to a photomultiplier tube for quantitative determination of light level. The amount of light specularly reflected by the test surface is correlated to the density of particle coverage on the surface, and plotted on an X-Y record.
Claims3
A microdensitometer for measuring and recording relative reflectance of a specularly reflecting surface, including:
- an illuminating microscope disposed on an illumination optical axis relative to said reflecting surface and including a light source, a condensor lens, an aperture and a first objective lens in optical alignment along said illumination optical axis, said light source and said first objective lens being in conjugate relationship to said condenser lens, said aperture and said reflecting surface being in conjugate relationship relative to said first objective lens,
- A collecting microscope disposed on a reflection optical axis to said reflecting surface and including a second objective lens, a field lens, and an optical probe in optical alignment along said reflection optical axis, said reflecting surface and said field lens being in conjugate relationship relative to said second objective lens, said second objective lens and said optical probe being in conjugate relationship relative to said field lens,
- said illumination and reflection optical axes being disposed at equal and opposite angles relative to said reflecting surface,
- whereby an image of said reflecting surface is projected to said field lens to attenuate the light transmission of said field lens in proportion to the extent of particle coverage of said reflective surface.
Dependencies are inferred from the claim text.