Modular programmable digital scan converter
AssigneeHughes Aircraft Company
InventorsEugene W. Opittek, James L. Heard, Bruce W. Keller, Michael D. Pruznick, Thomas A. Bosseler
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AssigneeHughes Aircraft Company
InventorsEugene W. Opittek, James L. Heard, Bruce W. Keller, Michael D. Pruznick, Thomas A. Bosseler
Estimating the term…
A digital scan converter which comprises modular video processing units and modular memory and output units is adapted for processing applied sensor data of various formats so as to provide output data suitable for display on a common indicator. Parameters for processing operations, such as analog-to-digital converting, integrating and detecting, are implemented by the video processing modules in response to digital "set-up" and address words applied from a programmed microprocessor controller. The storage and readout format of the memory and output modules is also controlled by "set-up" and address words applied from the programmed controller.
A modular programmable digital scan converter adapted for responding to applied control signals and to sensor data of various formats so as to provide display data, said scan converter comprising:
Dependencies are inferred from the claim text.
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No related US applications are recorded in the indexed filing history.
Using an arrangement for ejection of an inserted card: the ejection arrangement being of the push-push kind
Means for transforming co-ordinates or for evaluating data, e.g. using computers: scan converters
General purpose image data processing: image acquisition
Graphical data reading
Term ended 11 Oct 1994 (estimated)
USPTO file history isn’t available for this patent, so only indexed dates are shown.
1. Field of the Invention
This invention relates generally to digital scan conversion techniques and more particularly to modular programmable digital scan converters responsive to a variety of types of sensor inputs.
2. Description of the Prior Art
FIG. 1 is a functional block diagram of the modular digital scan converter of the invention.
FIG. 2 illustrates the BIT-fault isolation concept of the programmable modular digital scan converter.
FIG. 3 illustrates a logical grouping of core modules into the main subsystems of the invention.
Although specific embodiment of the invention will now be described with reference to the drawings, it should be understood that such embodiments are by way of example only and merely illustrative of but a small number of the many possible specific embodiments which can represent applications of the principles of the invention. Various changes and modifications obvious to one skilled in the art to which the invention pertains are deemed to be within the spirit, scope and contemplation of the invention as further defined in the appended claims.
Referring to FIG. 1, the input video processing subsystem 10 receives signal input in the form of sensor video and synchronizing signals on a lead 6. Signal information as output from the input video processing subsystem 10 is available at serial data bus 20 by means of composite lead 30 which also provides required internal signals to input video processing subsystem 10. Processed digital video information is fed by means of composite lead 22 from input video processing subsystem 10 to memory and output video processing subsystem 12. Memory and output video processing subsystem 12 also receives signal input in the form of external TV video by means of composite lead 38; required internal signals by means of composite lead 34 from serial data bus 20; and symbol video signals from symbol generation subsystem 16 by way of composite lead 28. Memory and output video processing subsystem 12 outputs TV video signal to television display indicator 18 by way of composite lead 24. Mode and control signals are received by interface and control subsystem 14 on a lead 8 and are available by means of composite lead 32 at serial data bus 20. After processing by interface and control subsystem 14, mode and control signals are fed by way of parallel data bus 26 into symbol generation subsystem 16. Symbol generation subsystem 16 communicates with serial data bus 20 by means of composite lead 36.
The built-in-test (BIT) fault isolation concept of the overall system is illustrated by FIG. 2. Serial data bus 20 receives and furnishes inputs from and to interface 40 which accepts external stimuli and provides test results to an external computer. Digital scan control modules 42 generate and select test stimuli and store logic status. Controller 14 and symbol generator 16 have outputs incident upon display unit 18.