Device for detecting the unevenness of a curved surface
AssigneesHitachi, Ltd., Hitachi Metals, Ltd.
InventorsRaiji Shimomura, Toru Habu, Hisaaki Itoh, Naomi Sakai, Tatsuo Goto
Life of this patent
Estimating the term…
Abstract
In a detecting device of the unevenness of a curved surface of an object, the detecting device is characterized by providing means for seizing or holding the object, means for moving the seizing means in a predetermined direction, a variation detector for detecting the presence of a projection or a recess on the surface of the object, a supporting means including at least two contact members which contact the surface of the object for supporting the variation detector at a position corresponding to the position of the surface, and means for guiding the supporting means in response to the position variation of the surface.
Claims18
A device for detecting the unevenness of a circumferential surface of a cylindrical-like member comprising:
- means for seizing the cylindrical-like member;
- means for rotating said seizing means such that said cylindrical-like member is rotated about an axis of rotation;
- means for detecting at least one projection or recess on the circumferential surface of said cylindrical-like member;
- supporting means including at least two contact members which contact the circumferential surface of said cylindrical-like member for supporting said detecting means at a position relative to the surface of said cylindrical-like member;
- and
- means for guiding said supporting means so as to maintain contact of said contact members with the circumferential surface of said cylindrical-like member.
A device according to claim 8, wherein said second means comprises a pair of plate springs connected to each other.
Dependencies are inferred from the claim text.