X-ray beam perpendicular finder
OwnerAlexis Neal de Gastoninventor
Life of this patent
Estimating the term…
Abstract
A pair of separated semi-radio opaque sheets having a similar target pattern removed therefrom are placed in parallel alignment with the targets in perpendicular alignment. When exposed to an X-ray beam of a diagnostic X-ray machine, the targets produce a pattern in the radiograph in which the two targets are superimposed in slight misalignment except where the X-ray beam is perpendicular, thereby locating the perpendicular X-ray beam position with respect to the collimator jaws and visual target of the machine.
Claims8
A device for finding the location of the perpendicular ray of an X-ray beam field including:
- first and second semi-radio opaque layers each defining a pattern therethrough removed therefrom, said pattern being defined by cutouts formed with edges perpendicular to said semi-radio opaque layers;
- and
- means to space and maintain said first and second semi-radio opaque layers in parallel alignment with their pattern in perpendicular registry, said means including a nonradio opaque member having parallel sides to which said layers are attached.
A process for locating the perpendicular ray of an X-ray beam field with respect to the location indicated to be the center of the field by an X-ray machine including the steps of:
- placing a device having first and second semiradio opaque sheets each having a protective nonradio opaque parallel surface layer on one surface thereof, a similar plurality of portions removed therethrough to define a pattern and means to space and maintain said first and second semi-radio opaque sheets in parallel alignment with their patterns in perpendicular registry including a block having parallel sides to which said sheets are connected on the opposite sides thereof from said protective layers, said block being constructed from a material allowing easier passage of X-rays than the material from which said sheets are constructed, in a known position with respect to the indicated center of the field;
- exposing a medium sensitive to X-rays through said device by producing an X-ray beam with the X-ray machine;
- and
- comparing the positions of the misalignments of said patterns, lines through registered portions of said patterns intersecting at the location of said perpendicular ray.
Dependencies are inferred from the claim text.