US 4,047,780 AGranted

Test contactor system for semiconductor device handling apparatus

OwnerNicholas J. Cedroneinventor

Life of this patent

Estimating the term…

Loading patent…

Abstract

A plurality of elongated bridging contacts each extending in a first direction are mounted on a pair of support blocks that are driven in a symmetrical, reciprocating motion between first and second limit positions. In the first position each contact makes electrical connection at one end with a lead of a semiconductor device to be tested and at the other end with a contact pin that is connected directly to a load board. The contacts are preferably pivotable to a limited degree about a point intermediate the contacting ends and flex slightly when in the first position to develop a good contact force. In the second position the contacts are spaced from the leads and the pins. Driving means for the support blocks, as well as the support blocks themselves, are structured to provide a minimum separation along the first direction between the load board and the device (preferably less than 25 millimeters) and an unrestricted mating plane for the load board. In a preferred form, the support blocks mount on a pair of opposed cross heads which in turn mount on a pair of slidable rods. The symmetrical, reciprocating motion is generated by spring means that urges the cross heads together and cam means, acting through a pivoted arm linked to both slide rods, that urge the cross heads apart.

Claims9

Dependent claims

Means for reliably making and breaking electrical connection at a high repetition rate between a succession of electronic devices, each having a plurality of leads extending generally in a first direction, and a load board in electrical connection with a like plurality of pins spaced from said leads along said first direction, comprising, in combination,

a plurality of contacts,
means for supporting said contacts so that each contact extends generally in said first direction, said support means being movable between first and second limit positions spaced from one another along a third direction transverse to said first direction, and each of said contacts being positioned on said support means to make electrical connection between one of said leads and one of said pins when said support means is in said first limit position and to break electrical connection with both said one of said leads and said one of said pins when said support means is in said second limit position, said limit position spacing being sufficiently large that said contacts in said second limit position avoid connection with said leads while allowing a wide degree of variation in the location of said leads measured in said third direction, and
means for driving said means in a precisely controlled, symmetrical movement between said first and second limit positions,
said driving means and said support means being structured so that their surfaces adjacent said load board are unlimited in a plane substantially perpendicular to said first direction and they extend in said first direction for a distance comparable to that of said contacts to minimize the spacing between said device and said load board.

1 more element

Dependencies are inferred from the claim text.

Facts

Application: 05/674,498Filed 7 Apr 1976
Granted: 13 Sep 1977
Term ends: Not estimatedThe source records don’t support an estimate.

Classification5 codes

G01R 1/07314
With individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or…:…
G01R 1/0433
Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets: sockets for IC's or transistors
G01R 1/073
Measuring probes: multiple probes
G01R 31/2893
Testing of integrated circuits [IC]: handling, conveying or loading, e.g. belts, boats, vacuum fingers