Method of manufacturing a semiconductor device
AssigneeNippon Electric Co., Ltd.
InventorsYasukazu Inoue, Shoji Fujimoto
Life of this patent
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Abstract
A silicon layer is deposited over the insulating layer covering the surface of the semiconductor substrate and apertured to define a contact window through which the silicon layer is connected with a one-conductivity-type region formed in the semiconductor substrate. An impurity of the one conductivity type is introduced into the one-conductivity-type region through the contact window from the silicon layer. This impurity may be supplied from the surface of the silicon layer or may be preliminarily doped in the silicon layer. A conductive layer is deposited over the silicon layer and is formed to a predetermined pattern. Thereafter, the silicon layer is formed to the same pattern.
Claims13
A method of manufacturing a semi-conductor device comprising the steps of:
- forming a semiconductor region of one conductivity type in a semiconductor substrate;
- forming a contact window in an insulating film covering the surface of said semiconductor substrate to expose at least a portion of the surface of said semiconductor region;
- depositing a layer of silicon over the insulating layer;
- introducing an impurity of said one conductivity type into said semiconductor region through said contact window;
- depositing a conductive layer over the silicon layer;
- defining a pattern in said conductive layer;
- and thereafter removing a portion of said silicon layer that is not covered by the conductive layer of said pattern.
A method of manufacturing a semiconductor device comprising the steps of
- forming a region of one conductivity type in a semiconductor substrate,
- covering the surface of said semiconductor substrate with an insulating layer,
- forming a contact window for said region in said insulating layer,
- depositing a polycrystalline silicon layer over said insulating layer,
- diffusing an impurity of said one conductivity type into said polycrystalline silicon layer,
- depositing an aluminum layer over said polycrystalline silicon layer,
- defining a pattern in said aluminum layer, and
- defining the same pattern in said polycrystalline silicon layer.
A method of manufacturing a semiconductor device comprising the steps of
- forming a region of one conductivity type in a semiconductor substrate,
- covering the surface of said semiconductor substrate with an insulating layer,
- forming a contact window for said region in said insulating layer,
- depositing a silicon layer doped with an impurity of said one conductivity type over said insulating layer,
- diffusing said impurity from said silicon layer into said region through said contact window,
- depositing an aluminum layer over said silicon layer,
- defining a pattern in said aluminum layer, and
- defining the same pattern in said silicon layer.
A method of manufacturing an insulated-gate field-effect semiconductor device comprising the steps of
- forming a source region and a drain region of one conductivity type in a semiconductor substrate of the opposite conductivity type,
- covering the surface of said semiconductor substrate with an insulating layer,
- forming contact windows for said source and drain regions in said insulating layer,
- depositing a polycrystalline silicon layer over said insulating layer.
- introducing an impurity of said one conductivity type from said polycrystalline silicon layer through said contact windows into said source and drain regions, respectively,
- depositing a conductive layer over said polycrystalline silicon layer,
- defining a pattern in said conductive layer, and
- defining the same pattern in said polycrystalline silicon layer.
Dependencies are inferred from the claim text.