US 4,045,736 AGranted

Method for composing electrical test patterns for testing AC parameters in integrated circuits

AssigneeIBM Corporation

InventorsRobert Gordon Carpenter, Chester C. Chao

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Abstract

A method is provided for generating electrical test patterns for testing functional AC parameters of integrated semiconductor circuits from the test patterns used for the more conventional testing of the DC parameters of such circuits. The AC parameters include such factors as rise time, fall time and circuit delays. Starting with a DC pattern known to be sufficient for the DC testing of the circuit to be tested, each increment of the DC pattern which comprises a plurality of parallel bilevel signals is applied to a corresponding plurality of input points in a standard of the circuit, preferably computer simulated. The resulting output is sensed at output points in the circuit standard. Then, one by one, the input signals in the applied increment are changed while the remainder of the signals are maintained at their original levels. When a change in one of the signals produces a corresponding change in the output, this is noted as path for AC testing. Then, there is stored as the first AC increment, a signal pattern wherein all the signals in the increments are maintained at their original levels except the input producing the change in output, which is stored as a pulsed signal. The procedure is repeated for a plurality of signals in the increment and for a plurality of remaining increments in the DC pattern until an AC signal pattern is developed in which all the input points in the circuit standard are pulsed at least once.

Claims14

Dependent claims

A method for composing electrical test patterns for testing AC parameters in integrated semiconductor circuits comprising:

applying to a plurality of input points in a standard of the circuit to be tested, the first increment of a bilevel DC electrical signal input pattern, the increments of which each comprise a plurality of parallel bilevel signals, each signal being respectively applied to one of said plurality of input points;
sensing, as at least one output point in said circuit standard, the bilevel output signal resulting from said input pattern increment;
changing the level of one of said parallel signals in said increment from its original level to the other of the two levels while maintaining the remaining parallel signals at their original levels;
determining whether said change in said input increment signal produces a corresponding change in one bilevel output signal;
if there is such a change in said output signal, storing, as part of said AC test pattern being composed, an increment comprising said bilevel DC increment in which said signal which produced the change is pulsed and the remaining signals are maintained at their original levels, said AC increment providing a test for the input point to which said pulsed signal is applied;
repeating said procedure by changing the level of different ones of said parallel signals in said input increment while maintaining the remaining signals at their original levels until one of said changes produces a corresponding output signal change and then recording and storing, as part of an AC test pattern, an increment in which the change producing signal is pulsed and the remaining signals are maintained at their original levels;
then applying to said plurality of input points, a second increment of said DC signal input pattern, and repeating said procedure of determining whether changing the level of different ones of the parallel signals in said second increment produces a corresponding output change, and then storing and recording an appropriate AC pattern increment in accordance with said procedure;
and,
repeating said procedures of changing different ones of parallel signals in a sequence of applied DC input pattern increments until there is recorded and stored a plurality of the AC test pattern increments such that there is at least one AC pattern increment in which a pulsed signal is applied to each of the input points preselected to be AC tested.

6 more elements

A system for generating electrical test patterns for testing AC parameters in integrated semiconductor circuits comprising:

a standard of the circuit to be tested;
means for applying to a plurality of input points in said standard of the circuit the sequential increments of a bilevel DC electrical signal input pattern, the increments of which each comprise a plurality of parallel bilevel signals, each signal being respectively applied to one of said plurality of input points;
means for sensing, at at least one output point in said circuit standard, the bilevel output signal resulting from the input pattern increment being applied;
means for sequentially changing the level of different ones of said parallel signals in said increment from its original level to the other of the two levels, while maintaining the remaining parallel signals at their original levels while a given one of said parallel signals is being changed;
means for determining whether said change in said input increment signal produces a corresponding change in one bilevel output signal;
and
means, activated by such a change in said output signal, for storing, as part of said AC test pattern being generated, an increment comprising said bilevel DC increment in which said signal which produced the change is pulsed and the remaining signals are maintained at their original levels, said AC increment providing a test for the input point to which said pulsed signal is applied.

4 more elements

Dependencies are inferred from the claim text.