Apparatus for tomography comprising a pin hole for forming a microbeam of X-rays

An apparatus for obtaining a two-dimensional display of the X-ray absorption distribution on a cross-sectional plane of an object comprising:

• a. means for generating an electron beam directed along a center beam axis,
• b. an annulr or partially annular target having a conical surface, the axis of which coincides with the axis of the center beam generated by the electron beam source,
• c. a means for deflecting said electron beam from the center beam axis to the target,
• d. a means for rotating said electron beam around the target thereby generating X-radiation at the location of impingement,
• e. a beam guide having a pin hole or pin holes for directing the X-ray microbeam onto the object,
• f. a detecting means for detecting and measuring the intensity of the X-ray passed through the object,
• g. a memory for memorizing the output of said detecting means along with the corresponding output signals from the rotating means,
• h. means for calculating the absorption value at each micro matric area on said cross-sectional plane from the data memorized in the memory, and
• i. means for displaying said respective calculated absorption values two dimensionally.

An apparatus for obtaining a two-dimensional display of the X-ray absorption distribution on a cross-sectional plane of an object comprising:

• a. means for generating an electron beam directed along a center beam axis,
• b. an annular or partially annular target having a conical surface, the center axis of which coincides with the axis of the center beam generated by the electron beam source,
• c. means for deflecting said electron beam from said center beam to the target,
• d. a means for rotating the electron beam around the target thereby generating X-radiation at the location of impingement,
• e. a stigmator for changing the cross-sectional shape of the electron beam in synchronism with the rotating means,
• f. a beam guide having a pin hole or pin holes for directing the X-ray microbeam upon the object,
• g. a detecting means for detecting and measuring the intensity of the X-ray passed through the object,
• h. a memory for memorizing the output of said detecting means along with the corresponding output signals from the rotating means,
• i. a calculating means for calculating the absorption value at each micro matrix area on said cross-sectional plane from the data memorized in the memory, and
• j. a display means for displaying said respective calculated absorption values two-dimensionally.