Apparatus for the treatment of yarn thickness variation signals
AssigneeAsahi Kasei Kogyo Kabushiki Kaisha
InventorTsugio Goto
Life of this patent
Estimating the term…
Abstract
This invention relates to a method and apparatus for processing yarn defect signals of a plurality of yarns on the on-line base. For this purpose and in the case of the signal processing apparatus according to this invention a large number of yarn defect signals are processed through a scanning device for signal sampling, means is provided for placing possible drop-out signals into respective provisional memories, and preferably in the form of a binary "1" from a binary "0" and for reading out the contents from the memories at the beginning the next succeeding sampling period and for further processing these read-out yarn defects signals, together with regular yarn defects signals under processing through regular samplings.
Claims1
An apparatus for processing defect signals from a plurality of yarns wherein said signals may be applied to a computer, said apparatus comprising:
- a. a plurality of sensor means, each sensor means associated with one of said yarns for detecting a defect in said yarns;
- b. a plurality of memory means, each of said memory means coupled to a corresponding one of said sensor means for storing a defect signal produced by the corresponding said sensor means;
- c. scanner means coupled to said plurality of memory means and to said computer for cyclically sequentially sampling the signals stored in said memory means and applying the signals stored therein to said computer;
- and
- d. reset means for periodically resetting said memory means at the beginning of each sampling cycle.
Dependencies are inferred from the claim text.