Integrating component measuring device
AssigneeHewlett-Packard Company
InventorsHitoshi Noguchi, Kohichi Maeda, Takeshi Kyo
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AssigneeHewlett-Packard Company
InventorsHitoshi Noguchi, Kohichi Maeda, Takeshi Kyo
Estimating the term…
A method and means for measuring the electric properties of capacitor, inductor and resistor elements is described. The element to be measured and a reference element are connected in series, and standard A.C. voltage is applied to one end of the series circuit whereas a variable voltage is applied to the other end of said circuit. The variable voltage is controlled in order to zero the voltage or the current at the common junction of both the element to be measured and the reference element. Said standard voltage and said variable voltage are rectified, and the generated D.C. signals are used for charging integrator capacitors. These capacitors are then discharged and the ratio of charging and discharging time is a measure of the resistance, capacitance and inductance, respectively, of the unknown element. Dielectric and magnetic dissipation factors may be measured in a similar manner.
A method for measuring the electric properties of capacitance, inductance and resistance of an element to be measured, said method comprising the steps of:
An apparatus for measuring the electric properties of capacitance, inductance and resistance of an element to be measured comprising:
Dependencies are inferred from the claim text.