Method and a device for localizing a light impact on the photocathode of a photomultiplier
AssigneeCommissariat a l'Energie Atomique
InventorsRene Odru, Jacques Vacher
Life of this patent
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Abstract
A light impact on the photocathode of a photomultiplier is localized by defocusing the beam of emitted photoelectrons, sweeping the surface of the photocathode by means of a localized electric field which is located in the vicinity of the photocathode and by measuring the time which elapses between the instant of commencement of sweeping of the photocathode surface and at least one change of sign of the anode signal.
Claims8
A method of localization of a light impact on the photocathode of a photomultiplier, comprising defocusing the beam of emitted photoelectrons of said photomultiplier, sweeping the surface of the photocathode by means of a localized electric field, said electric field being located in the vicinity of the photocathode, and measuring the time which elapses between on the one hand the instant of commencement of sweeping of the photocathode surface and on the other hand at least one change of sign of the anode signal of said photomultiplier.
Dependencies are inferred from the claim text.