Method and apparatus for two-dimensional data acquisition
AssigneeParticle Measuring Systems, Inc.
InventorsRobert George Knollenberg, Albury John Dascher
Life of this patent
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AssigneeParticle Measuring Systems, Inc.
InventorsRobert George Knollenberg, Albury John Dascher
Estimating the term…
Two-dimensional data may be acquired at extremely high rates by means of a linear sensor array, and ganged shift registers with each sensor associated with at least one shift register. The state of each sensor is sampled periodically in accord with a selected, relatively high clock frequency and each sampling is sequentially recorded in the shift register associated with a specific sensor. A first dimension is provided by the linear nature of the sensor array and the second dimension is supplied by the sampling clock frequency as a subject moves past the sensor array. In a more advanced embodiment, the sampling operates only during the occurrence of an event and data is cyclically recorded in one group of shift registers at a rapid rate while previous data is unloaded from an alternative group of shift registers at a conventional rate.
A system for high-speed acquisition of two-dimensional data, comprising:
A system for acquisition of two-dimensional data comprising:
A method of acquiring intermittently occurring data at rapid rates while providing the data to data systems at convention rates comprising:
Dependencies are inferred from the claim text.