Second harmonic analyzer
AssigneeNorth American Philips Corporation
InventorsJoseph Patrick Dougherty, Stewart K. Kurtz, Robert John Seymour
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Abstract
A method and device for determining acentricities in a powder material by illuminating the powder with a collimated coherent light beam of given wave-length which generates a second harmonic in the material. The second harmonic with the fundamental removed by filters is divided by a beam splitter and sent to two photomultipliers -- one of which has a narrow band filter to select only light of one wave-length. If all the light is generated at the second harmonic equal signals are produced by the photomultipliers. If non-second harmonic radiation is produced, a larger signal will be produced in the unfiltered reference channel.
Claims10
A method of determining crystallographic acentricities in a powder sample comprising the steps of exposing the powder sample to a beam of collimated coherent radiation of given fundamental wave-length and intensity to generate the second harmonic of said radiation in said sample, removing the fundamental from the radiation after the sample to leave only the second harmonic, dividing the second harmonic into two separate beams one of which has a greater intensity than the other, the beam of lesser intensity serving as a reference beam, passing the beam of greater intensity through a filter having a narrow passband to limit said latter beam to the second harmonic only, reducing the intensity of said latter beam to balance said beams at the second harmonic frequency, detecting and displaying the intensities of each of said beams, and comparing the intensities of the respective beams to thereby determine acentricities in the powder sample.
A device for determining crystallographic acentricities in a powder sample comprising a source of coherent radiation of a given fundamental wave-length and intensity, means to position the sample in the path of said radiation to expose the sample thereto, means to remove the fundamental after passage through the sample leaving essentially only a second harmonic of the fundamental, means to divide the beam after the sample into two beams, a narrow pass filter in the path of one of the beams to limit the frequency in said beam to substantially only the second harmonic, means to balance the intensities of the two beams at the second harmonic frequency, means in the path of each of said divided beams to detect the intensity thereof, and means to display the relative intensities of said beams to thereby determine acentricities in the sample.
Dependencies are inferred from the claim text.