Process for hydrogenation reaction of unsaturated organic compounds
AssigneeKyowa Kagaku Kogyo Kabushiki Kaishi
InventorsYasuhisa Fukunaga, Akira Okada
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Abstract
When a solid reduction catalyst prepared by calcining and reducing at 350.degree. to 700.degree.C. in a hydrogen stream a precursor compound having a composition expressed by the following formula M.sub.x Ni.sub.y Al.sub.z (OH).sub.2x.sub.+2y.sub.+ex.sub.-tp (A).sub.p.sup.. aH.sub.2 O and having a layer lattice crystal structure characterized by the following X-ray diffraction pattern d (A) I/Io ______________________________________ 7.5-210.2 100 3.6-10.6 5 - 80 2.4-6.4 5 - 60 ______________________________________ Is employed for hydrogenation reduction of unsaturated organic compounds, the intended reduction products can be obtained at very high conversion and very high selectivity.
Claims11
A process for hydrogenation of organic compounds which comprises reducing with hydrogen an unsaturated organic compound wherein the organic compound is a carbonyl compound expressed by the following formula ##EQU3## wherein R is an alkyl or aralkyl group having up to 12 carbon atoms, R.sup.1 stands for a hydrogen atom or the group R, and R.sup.2 stands for a lower alkyl group having up to 4 carbon atoms.
- in the presence of a solid catalyst for reduction, wherein the solid reduction catalyst consists essentially of a product obtained by calcining and reducing at a temperature of 350.degree. to 700.degree.C. in a hydrogen stream a precursor compound having a composition expressed by the following general formula
- M.sub.x Ni.sub.y Al.sub.z (OH).sub.2x.sub.+2y.sub.+3z.sub.-tp (A).sub.p .aH.sub.2 O
- wherein A stands for an anion, M stands for at least one metal selected from the group consisting of magnesium and zinc, t designates the valency of the anion A, and x, y, z, p and a are such numbers that when z is 2, the following relations are established:
- x + y = 0.1 to 20,
- x = 0 to 19.9, and
- y = 0.1 to 20
- and the following conditions are satisfied:
- 1/6>p/(x + y + z)>1/20, and
- a>0
- and having substantially the following diffraction pattern in the powder X-ray diffractiometry (Cu-K.alpha.)
- d (A) I/Io ______________________________________ 7.5 - 21.02 100 3.6 - 10.6 5 - 80 2.4 - 6.4 5 - 60 ______________________________________
Dependencies are inferred from the claim text.