Low cost, high accuracy & standards compliant isolation parameter test system and method for semiconductor devices

A contactor interface board for testing an electronic device installed in a socket, comprising:

• an AC voltage source having a first output terminal coupled to a first socket terminal and a second output terminal coupled to a reference node;
• a first circuit having a first high pass filter coupled between a second socket terminal and a first analog to digital converter;
• a second circuit having a low pass filter coupled between the second socket terminal and a second analog to digital converter;
• a third circuit having a second high pass filter coupled between second socket terminal and a third analog to digital converter;
• and
• a processor connected to outputs of the respective first, second, and third analog to digital converters, the processor configured to determine a partial discharge of the electronic device based on samples from the first analog to digital converter, determine a leakage current of the electronic device based on samples from the second analog to digital converter, and determine an arc current of the electronic device based on samples from the third analog to digital converter.

A method, comprising:

• applying an AC input signal to a first socket terminal of a socket;
• determining a partial discharge of an electronic device installed in the socket based on a high pass filtered voltage of a second socket terminal responsive to application of the AC input signal to the first socket terminal;
• and
• concurrently with determining the partial discharge, determining a leakage current of the electronic device based on a low pass filtered voltage of the second socket terminal responsive to application of the AC input signal to the first socket terminal.