Current sensing capabilities for power semiconductor devices
AssigneeMicrochip Technology Incorporated
InventorsCam Pham, Yogesh Sharma, Shesh Pandey
Life of this patent
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AssigneeMicrochip Technology Incorporated
InventorsCam Pham, Yogesh Sharma, Shesh Pandey
Estimating the term…
A system, method, and apparatus providing current sensing capabilities for semiconductor devices. A method comprises sensing, through a first external connector of at least one semiconductor device package, a voltage on a first current path including a first semiconductor device of the at least one semiconductor device package; sensing, through a second external connector of the at least one semiconductor device package, a voltage on a second current path including a second semiconductor device of the at least one semiconductor device package; and detecting that a magnitude of current through the first current path is different from a magnitude of current through the second current path based on the voltage on the first current path and the voltage on the second current path.
A system comprising:
A semiconductor device package comprising:
A method comprising:
Dependencies are inferred from the claim text.