Inspection systems, devices, and methods using polarized light

An inspection system comprising:

• an illumination apparatus including a light source positioned to illuminate a component with polarized light;
• an image acquisition apparatus including an optical sensor positioned to detect light reflected from the component, the image acquisition apparatus including an analyzer having a polarization axis oriented to limit polarized light reflected from the component via specular reflection;
• and
• a controller in communication with the image acquisition apparatus, the controller configured to:
• receive optical data indicative of non-polarized light reflected or scattered from the component from the optical sensor;
• and
• identify at least one defect on the component based on the optical data.

A method for inspecting a component, the method comprising:

• illuminating a portion of surface of a component with polarized light via a light source;
• receiving optical data indicative of non-specular reflection of the polarized light reflected from the surface of the component via an optical sensor;
• and
• identifying at least one defect on the surface of the component based on the optical data.