Inspection device and inspection method
AssigneeHitachi Industry & Control Solutions, Ltd.
InventorsTadahiro KATANE, Atsufumi SODEYAMA, Nozomu KIRIU, Kazuki TSUSHIMA, Isao SHINADA, Takahiro KUSAKA
Life of this patent
Estimating the term…
Loading patent…
AssigneeHitachi Industry & Control Solutions, Ltd.
InventorsTadahiro KATANE, Atsufumi SODEYAMA, Nozomu KIRIU, Kazuki TSUSHIMA, Isao SHINADA, Takahiro KUSAKA
Estimating the term…
The present invention improves the accuracy of visual inspection. An inspection device comprises: an image processing unit for performing image processing on a video image captured of an inspected object; an Al processing unit for labeling a foreign object captured in a video image of an inspected object on the basis of a learning parameter that has been obtained by learning training data which is a combination of a video image captured of an inspected object and an indicator indicative of whether the inspected object is a non-defective item or a defective item; and a determination unit for determining whether an inspected object is a non-defective item or a defective item on the basis of the video image that has been processed by the image processing unit and a video image that has been labeled by the Al processing unit.
An inspection device comprising:
An inspection method comprising the steps of:
Dependencies are inferred from the claim text.