Material testing machine
AssigneeShimadzu Corporation
InventorHiroshi TSUJI
Life of this patent
Estimating the term…
Abstract
One aspect of a material testing machine according to the present invention comprises a detection unit configured to detect a test force by a strain gauge type sensor using a bridge circuit, a voltage application unit configured to apply an excitation voltage to the bridge circuit, and a voltage control unit configured to control the voltage application unit so as to apply a warm-up excitation voltage to the bridge circuit during at least a partial period between a start of application of the excitation voltage to the bridge circuit and execution of test force measurement, the warm-up excitation voltage being higher than a voltage value at the time of test force measurement by the detection unit and equal to or lower than a maximum voltage value allowed for the detection unit.
Claims9
A material testing machine comprising:
- a detection unit configured to detect a test force by a strain gauge type sensor using a bridge circuit;
- a voltage application unit configured to apply an excitation voltage to the bridge circuit;
- and a voltage control unit configured to control the voltage application unit so as to apply a warm-up excitation voltage to the bridge circuit during at least a partial period between a start of application of the excitation voltage to the bridge circuit and execution of test force measurement, the warm-up excitation voltage being higher than a voltage value at the time of test force measurement by the detection unit and equal to or lower than a maximum voltage value allowed for the detection unit.
Dependencies are inferred from the claim text.