Metrology apparatus
AssigneeRenishaw PLC
InventorsAndrew Geoffrey BUTTER, Benjamin George HOY
Life of this patent
Estimating the term…
Loading patent…
AssigneeRenishaw PLC
InventorsAndrew Geoffrey BUTTER, Benjamin George HOY
Estimating the term…
An apparatus including first and second relatively reorientable members and an indexer arrangement configured to provide a plurality of angularly indexed lockable positions of the members about a first axis. The indexer arrangement includes: i) a series of features provided on the first member, extending annularly around the first axis; and ii) at at least three discrete annularly-spaced locations on the second member, an engagement feature is provided which is configured to intermesh with a subset of the features on the first member when in the locked state thereby providing, at each indexed position, a stable, repeatable relative rest position of the members. The apparatus further includes at least a first non-contact sensor mounted to the second member, the sensor being configured to sense a region on the first member and thereby provide a signal dependent on the spatial configuration of the members when in their locked state.
An apparatus comprising first and second relatively reorientable members and an indexer arrangement which is configured to provide a plurality of angularly indexed lockable positions of the first and second members about a first axis, in which the indexer arrangement comprises:
Dependencies are inferred from the claim text.