Memory devices and methods of manufacturing thereof
AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorsMeng-Sheng Chang, Chia-En Huang, Yih Wang
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AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorsMeng-Sheng Chang, Chia-En Huang, Yih Wang
Estimating the term…
A memory device includes first nanostructures stacked on top of one another; first gate stacks, where two adjacent ones of the first gate stacks wrap around a corresponding first nanostructure; second nanostructures stacked on top of one another; second gate stacks, where two adjacent ones of the second gate stacks wrap around a corresponding second nanostructure; a first drain/source feature electrically coupled to a first end of the first nanostructures; a second drain/source feature electrically coupled to both of a second end of the first nanostructures and a first end of the second nanostructures; and a third drain/source feature electrically coupled to a second end of the second nanostructures. At least one of the plurality of first gate stacks is in direct contact with at least one of the first drain/source feature or the second drain/source feature.
A method for fabricating a memory device, comprising:
A method for fabricating a memory device, comprising:
A method for fabricating a memory device, comprising:
Dependencies are inferred from the claim text.