Scheduling scan operations in memory sub-systems

A method comprising:

• determining, by a processing device, for each voltage offset bin of a plurality of voltage offset bins associated with respective subsets of memory blocks, a corresponding scheduling time offset of scan operations;
• scheduling, for a chosen voltage offset bin of the plurality of voltage offset bins, a scan operation based on a scheduling time offset associated with the chosen voltage offset bin;
• and
• performing the scan operation with respect to one or more memory blocks associated with the chosen voltage offset bin.

A non-transitory computer-readable storage medium comprising instructions that, when executed by a processing device, cause the processing device to perform operations comprising:

• determining, for each voltage offset bin of a plurality of voltage offset bins associated with respective subsets of memory blocks, a corresponding scheduling time offset of scan operations;
• scheduling, for a chosen voltage offset bin of the plurality of voltage offset bins, a scan operation based on a scheduling time offset associated with the chosen voltage offset bin;
• and
• performing the scan operation with respect to one or more memory blocks associated with the chosen voltage offset bin.