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US 2026/0300076 A1Published application
Radiation-hardened field-programmable gate arrays
AssigneeCarnegie Mellon University
InventorsKENNETH W. MAI, OGUN ONUR KIBAR, PRASHANTH MOHAN, AHMET OGUZ ATLI
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Abstract
Disclosed herein is a novel system and method for detecting, localizing, and correcting configuration upsets of an SRAM-based FPGA design caused by radiation exposure. The radiation-hardened FPGA uses embedded strike sensors distributed throughout the FPGA fabric, coupled with an error handler to correct the upsets using a redundant on-chip copy of the configuration.
Claims20
A radiation-hardened FPGA comprising:
- an FPGA fabric comprising a plurality of configuration frames, each configuration frame containing a plurality of configuration cells;
- one or more sensor circuits disposed in each of the plurality of configuration frames;
- an error handler;
- and
- memory containing redundant copies of the configuration frames;
- wherein the error handler reconfigures one or more configuration frames when a sensor located in the configuration frame senses an error, the error handler copying one or more redundant configuration cells from the memory to the one or more configuration frames in the fabric.
3 more elements
A method comprising:
- receiving, at an error handler on a FPGA, an error signal indicating a single event upset (SEU) error in one or more configuration frames in a fabric of the FPGA;
- determining one or more faulty configuration frames for reconfiguration based on an ID of one or more sensors detecting the SEU error;
- retrieving, from a memory on the FPGA, redundant copies of the one or more faulty configuration frames;
- and
- reconfiguring the one or more faulty configuration frames with the redundant copies.
2 more elements
Dependencies are inferred from the claim text.