Semiconductor device and measurement method
AssigneeRenesas Electronics Corporation
InventorsMasahiro ARAKI, Eiji YAMANAKA
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Abstract
A semiconductor device and measurement method capable of suppressing the effects of power supply noise is provided. The semiconductor device includes a terminal, a measurement unit that measures the current flowing to a capacitive touch element connected to the terminal via a first current path, and measures the current flowing to a resistive element instead of the touch element via a second current path branched from the first current path, and a correction unit that corrects the first current measurement value in the first current path based on the second current measurement value in the second current path.
Claims14
A semiconductor device comprising:
- a first terminal and a first current path for measuring the current flowing through a capacitive touch element connected to the first terminal, and a second current path branched from the first current path for measuring the current flowing through a resistive element instead of the touch element, and a correction unit for correcting the first current measurement value in the first current path based on the second current measurement value in the second current path.
A measurement method comprising:
- measuring the current flowing through a capacitive touch element in a first current path, measuring the current flowing through a resistive element instead of the touch element in a second current path branched from the first current path, and correcting the first current measurement value in the first current path based on the second current measurement value in the second current path.
Dependencies are inferred from the claim text.