Inspection member

An inspection apparatus configured to test characteristics of an inspection target, the inspection apparatus comprising:

• a contact layer configured to contact an inspection point of the inspection target;
• a socket substrate on the contact layer opposite to the inspection target;
• and
• a conductive body connected to the socket substrate opposite side to contact layer, the conductive body being configured to be connected to the inspection target through the socket substrate and the contact layer,
• wherein the contact layer comprises a plurality of contact sections separated from each other in a horizontal direction, and
• wherein each contact section of the plurality of contact sections is configured to move such that an upper surface of each contact section of the plurality of contact sections is inclined relative to a reference plane.

An inspection apparatus configured to test characteristics of an inspection target, the inspection apparatus comprising:

• a contact layer configured to contact an inspection point of the inspection target;
• a socket substrate on the contact layer opposite to the inspection target;
• and
• a conductive body connected to the socket substrate opposite to the contact layer, the conductive body being configured to be connected to the inspection target through the socket substrate and the contact layer,
• wherein the socket substrate comprises a plurality of socket sections separated from each other in a horizontal direction,
• wherein the contact layer comprises a plurality of contact sections on an upper surface of each socket section of the plurality of socket sections, and
• wherein a durometer hardness of the socket substrate is greater than a durometer hardness of the contact layer.