Magnetic field gradient sensor

A MEMS structure comprising:

• a first platform comprising a first material, and further comprising at least one object or at least one layer of a second material embedded in or mounted to or disposed on the first platform, the second material being a magnetic material having a first magnetization;
• a first flexible suspension anchored to a substrate to support or suspend the first platform, while allowing a first movement of the first platform in a first direction caused by an ambient force or acceleration and/or by an ambient magnetic field gradient;
• a second platform comprising a third material, and optionally further comprising at least one object or at least one layer of a fourth material embedded in or mounted to or disposed on the second platform, the fourth material being a non-magnetic material or being a magnetic material having a second magnetization different from the first magnetization;
• a second flexible suspension anchored to said substrate to support or suspend the second platform, while allowing a second movement of the second platform in said first direction caused by said ambient force or acceleration and/or by said ambient magnetic field gradient;
• at least one sensor configured for measuring at least one of the following:
• a characteristic of the first movement, a characteristic of the second movement, a characteristic of a difference between the first movement and the second movement.