Multi-band imaging spectrometer
AssigneeABB Schweiz AG
InventorAndre Villemaire
Life of this patent
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Abstract
A system includes a detector and at least one optical component that directs light toward the detector. The system also includes a spatially varying spectral filter that is positioned in the optical train and that has at least two bandpass zones: a first bandpass zone that passes light of a first wavelength range and a second bandpass zone that passes light of a second wavelength range that is different from the first wavelength range. The system also includes a circuit configured to perform a first transform operation on light of the first wavelength detected by the detector and to perform a second transform operation on light of the second wavelength detected by the detector.
Claims20
A system comprising:
- a detector positioned at an end of an optical path;
- a set of optical components positioned along the optical path such that the set of optical components directs light of a scene to the detector, the set of optical components comprising an interferometer configured to create a set of interferograms;
- a spatially varying spectral filter positioned along the optical path and configured to cause different regions of the detector to be exposed to different spectral bands of the light originating from the scene;
- and
- a processor communicatively coupled to the detector and configured to process the set of interferograms as detected by the detector in a manner that extracts spectral information from the set of interferograms.
A method of manufacturing a multi-band imaging spectrometer device, the method comprising:
- coupling a detector to circuitry, the circuitry configured to process interferograms generated by the detector;
- assembling an interferometer in optical communication with the detector, the interferometer configured to direct modulated light to the detector;
- mounting a spatially varying spectral filter in proximity to the detector and the interferometer, the filter being adapted to expose different regions of the detector to different spectral bands of the modulated light;
- and
- arranging a set of optical components such that light from a scene passes through the interferometer and the filter before reaching the detector.
A system comprising:
- a spectrometer comprising:
- a detector positioned at an end of an optical path,
- a set of optical components positioned along the optical path such that the set of optical components directs light of a scene to the detector, the set of optical components comprising an interferometer configured to create a set of interferograms,
- a spatially varying spectral filter positioned along the optical path and configured to cause different regions of the detector to be exposed to different spectral bands of the light originating from the scene, and
- a processor communicatively coupled to the detector and configured to process the set of interferograms as detected by the detector in a manner that extracts spectral information from the set of interferograms;
- and
- a mounting interface configured to attach the spectrometer to a remote sensing platform.
Dependencies are inferred from the claim text.