Processing method, method of manufacturing semiconductor device, recording medium, and processing apparatus
AssigneeKokusai Electric Corporation
InventorTatsuya YAMAGUCHI
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AssigneeKokusai Electric Corporation
InventorTatsuya YAMAGUCHI
Estimating the term…
A technique that includes: a first process of modifying a predetermined surface of a material, by performing a first operation including: (a1) supplying a precursor gas containing a first predetermined element and a halogen element to the material including the predetermined surface; (a2) after (a1), supplying a first modifying gas containing oxygen to the material; and (a3) after (a1), supplying a second modifying gas, which is different from the first modifying gas, to the material; and a second process of forming a film containing the first predetermined element on the modified predetermined surface after the first process, by performing a second operation a predetermined number of times, the second operation including: (b1) supplying the precursor gas to the material; and (b2) supplying a reaction gas to the material.
A processing method, comprising:
22 The processing method of claim 1, wherein the predetermined surface is a surface of a second predetermined material constituting the material, the second predetermined material containing a second predetermined element.
33 The processing method of claim 2, wherein, in (a1), a first atomic group containing the second predetermined element and the first predetermined element and a second atomic group containing the second predetermined element and the halogen element are formed on at least a part of the predetermined surface, and
A non-transitory computer-readable recording medium storing a program that causes, by a computer, a substrate processing apparatus, to perform:
A processing apparatus, comprising:
Dependencies are inferred from the claim text.