Processing solution, method for processing semiconductor substrate, and method for manufacturing semiconductor device
AssigneeTokyo Ohka Kogyo Co., Ltd.
InventorKazuya TAJIMA
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AssigneeTokyo Ohka Kogyo Co., Ltd.
InventorKazuya TAJIMA
Estimating the term…
Provided are a processing solution containing: (A) an oxidizing agent; (B) a compound capable of releasing a fluoride ion; (C) at least one selected from the group consisting of a nitrogen atom-containing heterocyclic ring-containing compound and a salt thereof as a first corrosion inhibitor; (D) at least one selected from the group consisting of an amine compound (1) having a specific structure and a salt thereof as a second corrosion inhibitor; and water, in which the content amount of (B) the compound capable of releasing a fluoride ion is 0.005 to 1 mass %, and the content amount of (C) the first corrosion inhibitor is 0.01 to 1 mass %, a method for processing a semiconductor substrate using the processing solution, and a method for manufacturing a semiconductor device using the processing solution.
A processing solution comprising:
Dependencies are inferred from the claim text.