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US 2026/0293231 A1Published application
Structure with spacer adjacent collector and related methods
AssigneeGlobalFoundries U.S. Inc.
InventorsJacob M. DeAngelis, Uppili S. Raghunathan, Sarah A. McTaggart, Megan Elizabeth Lydon-Nuhfer, Cameron Luce, Steven M. Shank, Vibhor Jain
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Abstract
The disclosure provides a structure with a spacer adjacent a collector, and related methods. A structure of the disclosure includes a collector on a subcollector, an intrinsic base on an inner portion of the collector, and a spacer on an outer portion of the collector. A lower portion of the spacer horizontally abuts the intrinsic base.
Claims20
A structure comprising:
- a first isolation layer on a subcollector, wherein a first air gap is between the first isolation layer and a collector of a bipolar transistor (BT);
- a second isolation layer on the first isolation layer and adjacent an intrinsic base of the BT;
- and
- a third isolation layer on the second isolation layer, vertically between the second isolation layer and an extrinsic base of the BT, wherein a second air gap is adjacent the third isolation layer and below the extrinsic base, and wherein the second isolation layer defines a physical boundary between the first air gap and the second air gap.
1 more element
(canceled)
A structure comprising:
- a bipolar transistor (BT) including a subcollector, a collector on the subcollector, an intrinsic base on the collector, an extrinsic base on a first portion of the intrinsic base, and an emitter on a second portion of the intrinsic base;
- and
- an isolation stack adjacent the BT, the isolation stack including:
- a first isolation layer on the subcollector, wherein a first air gap is between the first isolation layer and the collector, and wherein a portion of the first air gap is above a portion of the collector;
- a second isolation layer on the first isolation layer and adjacent the intrinsic base of the BT;
- and
- a third isolation layer on the second isolation layer, vertically between the second isolation layer and the extrinsic base of the BT, wherein a second air gap is adjacent the third isolation layer and below the extrinsic base, wherein the second isolation layer defines a physical boundary between the first air gap and the second air gap.
4 more elements
(canceled)
A method comprising:
- forming a first isolation layer on a subcollector, wherein a first air gap is between the first isolation layer and a collector of a bipolar transistor (BT);
- forming a second isolation layer on the first isolation layer and adjacent an intrinsic base of the BT;
- and
- forming a third isolation layer on the second isolation layer, vertically between the second isolation layer and an extrinsic base of the BT, wherein a second air gap is adjacent the third isolation layer and below the extrinsic base, wherein forming the second isolation layer defines a physical boundary between the first air gap and the second air gap.
1 more element
(canceled)
Dependencies are inferred from the claim text.