Sample support and method for manufacturing sample support
AssigneeHamamatsu Photonics K.K.
InventorTakamasa IKEDA
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Abstract
A sample support of an embodiment is a sample support for ionization of a sample. The sample support includes a substrate having a first surface, a second surface opposite to the first surface, and an irregular porous structure opening to at least the first surface. The porous structure is formed by a plurality of particles connected to each other. Particles of the plurality of particles that constitute the first surface have a rough surface on which an uneven structure is formed on a first surface side, and a non-rough surface on which the uneven structure is not formed on a second surface side.
Claims8
A sample support for ionization a sample, comprising:
- a substrate having a first surface, a second surface opposite to the first surface, and an irregular porous structure opening to the first surface,
- wherein the porous structure is formed by a plurality of first particles connected to each other, and
- outermost first particles of the plurality of first particles, which constitute the first surface, have a rough surface on which an uneven structure is formed on a first surface side, and a non-rough surface on which the uneven structure is not formed on a second surface side.
Dependencies are inferred from the claim text.