Peeling/flaking specification device, method, and program

Abstract

A processor of the peeling/flaking specification device acquires three-dimensional measurement data of a surface of a building measured by a three-dimensional measurement device such as a LiDAR at each inspection. The processor acquires difference data of the same measurement point on the surface of the building based on a plurality of pieces of three-dimensional measurement data measured for each inspection. The processor specifies a peeling/flaking portion on the surface of the building based on a characteristic of a change in the acquired difference data in a chronological order. For example, in a case where the change in the difference data in a chronological order turns from positive to negative, or decreases beyond a threshold value, a changed portion of the difference data is specified as the peeling/flaking portion on the surface of the building.

Dependencies are inferred from the claim text.