Adaptive super block wear leveling
AssigneeMicron Technology, Inc.
InventorsYing Yu Tai, Seungjune Jeon
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Abstract
A system can include a memory device comprising multiple dies, and a processing device, operatively coupled with the memory device, to perform various operations including identifying multiple management units to be programmed, where one management unit contains memory cells from a die having one endurance metric and another management unit contains memory cells from a die having another endurance metric, and determining a value of a media endurance metric for each management unit. The operations further include determining, for each management unit, a respective endurance exhaustion parameter defined by a relationship media endurance metrics, and distributing operations to each management unit based on the endurance exhaustion parameter.
Claims20
A system comprising:
- a memory device comprising a plurality of dies;
- and
- a processing device, operatively coupled with the memory device, configured to perform operations comprising:
- identifying a plurality of management units of the memory device to be programmed, wherein a first management unit comprises a first plurality of memory cells residing on a first die exhibiting a first value of a media endurance metric and a second management unit comprises a second plurality of memory cells residing on a second die exhibiting a second value of the media endurance metric, wherein a respective value of the media endurance metric is associated with a respective data retention capability of a corresponding die, wherein the second value of the media endurance metric is different from the first value of the media endurance metric;
- determining, for each management unit, a respective endurance exhaustion parameter that depends on a respective media endurance rating assigned to the management unit;
- and
- distributing memory access operations among the plurality of management units based on respective endurance exhaustion parameters.
A method comprising:
- identifying, by a processing device, a plurality of management units of a memory device to be programmed, wherein a first management unit comprises a first plurality of memory cells residing on a first die exhibiting a first value of a media endurance metric and a second management unit comprises a second plurality of memory cells residing on a second die exhibiting a second value of the media endurance metric, wherein a respective value of the media endurance metric is associated with a respective data retention capability of a corresponding die, wherein the second value of the media endurance metric is different from the first value of the media endurance metric;
- determining, for each management unit, a respective endurance exhaustion parameter that depends on a respective media endurance rating assigned to the management unit;
- and
- distributing memory access operations among the plurality of management units based on respective endurance exhaustion parameters.
A non-transitory computer-readable storage medium comprising instructions that, when executed by a processing device, cause the processing device to perform operations comprising:
- identifying a plurality of management units of a memory device to be programmed, wherein a first management unit comprises a first plurality of memory cells residing on a first die exhibiting a first value of a media endurance metric and a second management unit comprises a second plurality of memory cells residing on a second die exhibiting a second value of the media endurance metric, wherein a respective value of the media endurance metric is associated with a respective data retention capability of a corresponding die, wherein the second value of the media endurance metric is different from the first value of the media endurance metric;
- determining, for each management unit, a respective endurance exhaustion parameter that depends on a respective media endurance rating assigned to the management unit;
- and
- distributing memory access operations among the plurality of management units based on respective endurance exhaustion parameters.
Dependencies are inferred from the claim text.