Encoder-based logic built-in self test
AssigneeQUALCOMM Incorporated
InventorEswar Srinivas VADLAMANI
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Abstract
Aspects presented herein may enable a device to load bits specified for a selected logic built-in self-test (LBIST) test mode from an encoder, where the bits are hardcoded on the encoder, to reduce the programming time. For example, aspects presented herein may enable multiple/different test modes for LBIST to be configured, where each test mode may have its specified bits hardcoded in different registers. In one aspect, a device receives an indication to perform a LBIST test. The device loads a set of values from an encoder based on a test mode selected for the LBIST test, where the set of values is hardcoded on the encoder. The device outputs a configuration for the test mode based on the set of values.
Claims20
An apparatus at a device, comprising:
- at least one memory;
- and
- at least one processor coupled to the at least one memory, wherein the at least one processor is configured to:
- receive an indication to perform a logic built-in self-test (LBIST) test;
- load a set of values from an encoder based on a test mode selected for the LBIST test, wherein the set of values is hardcoded on the encoder;
- and
- output a configuration for the test mode based on the set of values.
A method at a device, comprising:
- receiving an indication to perform a logic built-in self-test (LBIST) test;
- loading a set of values from an encoder based on a test mode selected for the LBIST test, wherein the set of values is hardcoded on the encoder;
- and
- outputting a configuration for the test mode based on the set of values.
A computer-readable medium storing computer executable code at a device, the code when executed by at least one processor causes the at least one processor to:
- receive an indication to perform a logic built-in self-test (LBIST) test;
- load a set of values from an encoder based on a test mode selected for the LBIST test, wherein the set of values is hardcoded on the encoder;
- and
- output a configuration for the test mode based on the set of values.
Dependencies are inferred from the claim text.