Contour shape measuring device and method
AssigneeKobelco Research Institute, Inc.
InventorsYohei FURUTA, Nao YONEDA, Hiroto NISHIDA, Tsutomu MORIMOTO, Hideki SHIMPO
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AssigneeKobelco Research Institute, Inc.
InventorsYohei FURUTA, Nao YONEDA, Hiroto NISHIDA, Tsutomu MORIMOTO, Hideki SHIMPO
Estimating the term…
The present invention relates to a contour shape measuring device and a method for measuring a contour shape in a disk-shaped measurement target object having a beveled peripheral edge portion, in which the contour shape is measured as a shadow contour shape on the basis of a shadow image obtained by imaging a shadow of the peripheral edge portion generated by applying light onto the peripheral edge portion from a tangential direction of an outer periphery, the contour shape of the peripheral edge portion is measured as an optical contour shape by measuring a distance to the measurement target object using light from a surface direction, and the contour shape is obtained on the basis of the shadow contour shape and the optical contour shape.
A contour shape measuring device that measures a contour shape in a disk-shaped measurement target object having a beveled peripheral edge portion, the contour shape measuring device comprising:
A contour shape measuring method for measuring a contour shape in a disk-shaped measurement target object having a beveled peripheral edge portion, the contour shape measuring method comprising:
Dependencies are inferred from the claim text.