Target for film deposition and method for producing functional layer
AssigneeNippon Electric Glass Co., Ltd.
InventorsYoshimasa MATSUSHITA, Kosuke KARAKIDA, Fumio SATO
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Abstract
Provided are a target for film deposition and a method for producing a functional layer, both of which are suitable for production of a large-capacity memory device and an OTS element exhibiting a stable switching behavior. A target for film deposition contains, in terms of atomic %, 0.1% to 50% Ge, 40% to 90% Te, and 1% to 59% Si+Al+Ga+Sn+Bi+Cu+Ag+Zn+Y+In+Ca+Mg and is substantially free of Sb.
Claims15
A target for film deposition containing, in terms of atomic %, 0.1% to 50% Ge, 40% to 90% Te, and 1% to 59% Si+Al+Ga+Sn+Bi+Cu+Ag+Zn+Y+In+Ca+Mg and substantially free of Sb.
A target for film deposition made of a bulk chalcogenide glass that contains, in terms of atomic %, 0.1% to 50% Ge, 40% to 90% Te, and 1% to 59% Si+Al+Ga+Sn+Bi+Cu+Ag+Zn+Y+In+Ca+Mg and is substantially free of Sb.
A target for film deposition containing, in terms of atomic %, 0.1% to 50% Ge, 40% to 90% Te, and 1% to 59% Si+Al+Ga+Sn+Bi+Cu+Ag+Zn+Y+In+Ca+Mg, being substantially free of Sb, and containing a crystal portion.
A method for producing a functional layer using a target for film deposition,
- the target for film deposition being made of a bulk chalcogenide glass containing, in terms of atomic %, 0.1% to 50% Ge, 40% to 90% Te, and 1% to 59% Si+Al+Ga+Sn+Bi+Cu+Ag+Zn+Y+In+Ca+Mg and substantially free of Sb,
- the method comprising producing a functional layer containing, in terms of atomic %, 0.1% to 50% Ge, 40% to 90% Te, and 1% to 59% Si+Al+Ga+Sn+Bi+Cu+Ag+Zn+Y+In+Ca+Mg and substantially free of Sb.
A method for producing a functional layer using a plurality of targets for film deposition, wherein
- the targets for film deposition include a target for film deposition made of a Ga alloy or a Ga compound, and
- the functional layer is a variable-resistance layer or a phase-change layer each of which contains, in terms of atomic %, 0.1% to 50% Ge, 0.1% to 50% Ga, and 40% to 90% Te.
Dependencies are inferred from the claim text.