Apparatus and method for inspecting additively manufactured structure
AssigneeElectronics and Telecommunications Research Institute
InventorsKeo Sik KIM, Kyeeun KIM, Young Soon HEO
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Abstract
Provided are an apparatus and method for inspecting an additively manufactured (AM) structure. The apparatus includes a vision camera and a processor functionally connected to the vision camera. The processor generates a layer image for identifying a deposition state of an AM structure through the vision camera, measures defect features and layer features of the AM structure from the layer image, and estimates a mechanical property of the AM structure on the basis of the defect features and the layer features.
Claims20
An apparatus for inspecting an additively manufactured (AM) structure of an additive manufacturing process, the apparatus comprising:
- a vision camera;
- and
- a processor functionally connected to the vision camera,
- wherein the processor generates a layer image for identifying a deposition state of an AM structure through the vision camera;
- measures defect features and layer features of the AM structure from the layer image, and
- estimates a mechanical property of the AM structure on the basis of the defect features and the layer features.
An apparatus for inspecting an additively manufactured (AM) structure of an additive manufacturing process, the apparatus comprising:
- a first measurement module configured to measure defect features detected from a layer image of an AM structure, where the layer image is an image for identifying a deposition state;
- a second measurement module configured to measure layer features related to layer uniformity of the AM structure from the layer image;
- and
- an estimator configured to estimate a mechanical property of the AM structure on the basis of the defect features and the layer features.
A method of inspecting an additively manufactured (AM) structure performed by at least one processor, the method comprising:
- generating a layer image for identifying a deposition state of an AM structure through a vision camera;
- measuring defect features and layer features of the AM structure from the layer image;
- and
- estimating a mechanical property of the AM structure on the basis of the defect features and the layer features.
Dependencies are inferred from the claim text.