System and method for adaptive semiconductor process control
AssigneeQomplx LLC
InventorsJason Crabtree, Richard Kelley, Jason Hopper, David Park
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AssigneeQomplx LLC
InventorsJason Crabtree, Richard Kelley, Jason Hopper, David Park
Estimating the term…
A system and method for adaptive semiconductor process control integrates multi-modal sensor data, predictive modeling, and real-time optimization to dynamically manage semiconductor manufacturing processes. The system includes sensors collecting diverse process data, a processor that maintains a state model using particle-based estimation techniques, a knowledge graph for representing process relationships and economic factors, and a controller that adaptively adjusts manufacturing equipment. The processor generates topology-aware features from the state model by computing persistent homology at multiple scales and performing feature matching with confidence scoring. An upper confidence tree (UCT) optimization algorithm with super-exponential regret bounds dynamically adjusts exploration factors based on risk-weighted calculations. The system incorporates economic factors such as wafer value, energy costs, and maintenance costs while implementing just-in-context, just-in-time, and just-in-place measurement strategies. This enables comprehensive process monitoring and control while optimizing both technical performance and economic outcomes.
A semiconductor manufacturing control system comprising:
A method for controlling semiconductor manufacturing equipment, the method comprising:
A method for automated equipment retargeting in semiconductor manufacturing, comprising:
Dependencies are inferred from the claim text.