Method to correct wafer placement for channel implant
OwnerMandar Deshpande, Vincent Szeto +1inventors
InventorsMandar Deshpande, Vincent Szeto, Steve Drummond
Life of this patent
Estimating the term…
Loading patent…
OwnerMandar Deshpande, Vincent Szeto +1inventors
InventorsMandar Deshpande, Vincent Szeto, Steve Drummond
Estimating the term…
An ion implantation system includes a chuck configured to support a workpiece on a support surface. The chuck is configured to rotate about a twist axis, which is orthogonal to the support surface. The system further includes a robot arm having an end effector configured to transport the workpiece to and from the support surface of the chuck, with the chuck being in a first position. The system further includes a camera configured to capture one or more images of the workpiece disposed on the support surface of the chuck in the first position. The system further includes a controller configured to send instructions to the chuck to rotate about the twist axis or to the robot arm to move the workpiece to correct the orientation of the workpiece for ion implantation based on the images captured by the camera.
A workpiece processing system, comprising:
A method comprising:
Dependencies are inferred from the claim text.