Systems and methods for inverse design of optical multilayer thin film structures utilizing a foundation model

A system of inverse designing an optical multilayer thin film structure comprising:

• a computer-readable medium storing code for a foundation model having a transformer that includes neural network models and that utilizes structure serialization using tokens to represent materials and thicknesses of layers of optical multilayer thin film structures and that utilizes spectrum embedding to facilitate learning, by the model, of relationships between spectra and structure, the computer-readable medium also storing computer executable instructions that, when executed by a processor, configure the processor to:
• receive optical target parameters as an input prompt;
• generate data representing the optical multilayer thin film structure, based on the foundation model and the optical target parameters, the optical multilayer thin film structure having optical properties that satisfy the received optical target parameters;
• and
• output the data representing the optical multilayer thin film structure.

A method for inverse design of an optical multilayer thin film structure comprising:

• receiving, with at least one processor, optical target parameters based on an input prompt;
• applying, with the at least one processor, the received optical target parameters to a foundation model having a transformer that includes neural network models and that utilizes structure serialization using tokens to represent materials and thicknesses of layers of optical multilayer thin film structures and that utilizes spectrum embedding to facilitate learning, by the model, of relationships between spectra and structure;
• generating, with the at least one processor, data representing an optical multilayer thin film structure, based on an application of the foundation model to the optical target parameters, the optical multilayer thin film structure having optical properties that satisfy the received optical target parameters;
• and
• outputting, with the at least one processor, the data representing the optical multilayer thin film structure.