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US 2026/0277464 A1Published application
Apparatus with temperature-based management mechanism and methods for operating the same
AssigneeMicron Technology, Inc.
InventorXiaoyang Wang
Life of this patent
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Abstract
Disclosed herein are methods, apparatuses and systems related to detecting and managing erroneous temperature readings during operations. The apparatus may be configured to obtain prior operating temperature readings. When the obtained temperature reading satisfies an initial trigger, the apparatus may determine a synthetic temperature reading based on the prior temperature readings, outputs of other sensors, or a combination thereof.
Claims20
A memory device, comprising:
- a memory array having memory cells configured to store data;
- a board sensor configured to provide operating temperature readings of the memory device;
- and
- a memory controller operably coupled to the memory array and the board sensor, the memory controller configured to:
- obtain a current operating temperature reading from the board sensor, wherein the current operating temperature fails the operational threshold;
- compute a synthetic operating temperature reading based on prior operating temperature readings when the current operating temperature reading corresponds to an invalid signal, wherein the synthetic operating temperature reading represents an approximation of the current operating temperature;
- and
- perform memory operations on the memory array when the synthetic operating temperature reading satisfies an operational threshold for acceptable operating temperature readings of the memory device.
5 more elements
A method of operating a memory device, the method comprising:
- obtaining a current operating temperature reading from an internal sensor that provides operating temperature readings of the memory device;
- determining a synthetic operating temperature reading based on prior operating temperature readings of the memory device when the current operating temperature reading corresponds to an invalid signal;
- and
- in response to the synthetic operating temperature reading satisfying an operational threshold for acceptable operating temperature readings of the memory device, performing one or more memory operations on the memory device.
1 more element
A memory device, comprising:
- a memory array configured to store data;
- and
- a memory controller operably coupled to the memory array and configured to:
- obtain an operating temperature reading from a sensor external to the memory controller;
- compute a synthetic operating temperature reading based on prior operating temperature readings when the current operating temperature reading corresponds to an invalid signal;
- and
- perform memory operations according to the synthetic operating temperature reading instead of the operating temperature reading.
4 more elements
Dependencies are inferred from the claim text.