Test circuit and method for operating the same

A method for manufacturing a circuit array, comprising:

• providing a first switch, a second switch, a third switch, and a contact pad, wherein the contact pad is connected with a node of the first switch and a node of the second switch;
• coupling a drain of a first device of a first set of devices arranged in a first column and a drain of a second device of a second set of devices arranged in a second column to the contact pad, wherein there is no switch or device connected between the drain of the first device and the drain of the second device, and wherein there is no switch or device connected between any two of the node of the first switch, the node of the second switch, the contact pad, and the drain of the first device;
• coupling the drain of the first device and the drain of the second device to a signal receive node through the second switch;
• and
• coupling a source of the first device and a source of the second device to a second signal supply node through the third switch.

A method for operating a circuit array, the circuit array including:

• a first switch configured to simultaneously couple a first device of a first set of devices arranged in a first column and a second device of a second set of devices arranged in a second column to a first signal supply node, a second switch configured to simultaneously couple the first device and the second device to a signal receive node, and a contact pad connecting with a node of the first switch and a node of the second switch, wherein the first device and the second device are connected to the first switch and the second switch through the contact pad, wherein there is no switch or device connected between a drain of the first device and a drain of the second device, and wherein there is no switch or device connected between any two of the node of the first switch, the node of the second switch, the contact pad, and the drain of the first device, the method comprising:
• applying a first signal to the first device and the second device through the first switch;
• switching a logic state of the first device;
• switching a logic state of the second device;
• and
• detecting a short circuit via determining electrical continuity between a drain of the first device and a drain of the second device.