Eddy current (ec) defect view and defect classification
AssigneeEvident Canada, Inc.
InventorsRémi Leclerc, Michael Barbeyrol
Life of this patent
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AssigneeEvident Canada, Inc.
InventorsRémi Leclerc, Michael Barbeyrol
Estimating the term…
A presentation can be generated and displayed indicative of an eddy current (EC) inspection result. For example, an amplitude value or a phase value associated with the eddy current measurement signal can be presented in a graphical manner, such by aligning an indicium of the amplitude value or the phase value with a shape representative of an object under test, the indicium corresponding to a location on or within the shape where the eddy current measurement signal was obtained. In another example, a visual attribute of a displayed indicium of an amplitude value or phase value can be assigned based on a class of defect, such as using different colors corresponding to different defect classes as defined by regions in an impedance plane. Use of attribute to identify defect can be performed either separately, or in combination with alignment of the indicium with the shape.
A machine-implemented method, comprising:
14-19. (canceled)
A system comprising:
Dependencies are inferred from the claim text.