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US 2026/0276590 A1Published application
Row-column addressed 2d eddy current array
AssigneeEvident Canada, Inc.
InventorBenoit Lepage
Life of this patent
Estimating the term…
Abstract
Row-column addressing techniques can be applied to eddy current (EC) coil elements to reduce the number of multiplexers in a two-dimensional EC probe. Individual coil elements can then be controlled to provide more robust EC inspection capabilities. Leakage current issues can be addressed by using diodes and biasing techniques.
Claims21
1-20. (canceled)
A row-column addressed (RCA) eddy current array (ECA) probe, comprising:
- at least one coil array including a plurality of coil elements;
- a diode array including a plurality of diodes coupled to the plurality of coil elements;
- and
- a multiplexer assembly for row and column addressing of the plurality of coil elements.
1 more element
A method comprising:
- activating a first set of coil elements in a row-column addressed (RCA) eddy current array (ECA) using a drive signal and a bias signal, wherein the bias signal operating at least one diode coupled to the first set of coil elements in a forward region;
- and
- receiving an electrical representation of an induced eddy current using the RCA ECA.
A probe assembly for eddy current testing, the probe assembly comprising:
- a first layer of a printed circuit board including a first set of metallic traces for interleaved coil elements of a first coil array and a second coil array;
- a second layer of the printed circuit board including a second set of metallic traces for the interleaved coil elements of the first coil array and the second coil array;
- and
- a diode array coupled to the interleaved coil elements of the first coil array and the second coil array.
1 more element
Dependencies are inferred from the claim text.