Ion Analysis Method and Ion Analyzer
AssigneesShimadzu Corporation, National University Corporation Kobe University
InventorsOsamu FURUHASHI, Tohru KINUGAWA
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AssigneesShimadzu Corporation, National University Corporation Kobe University
InventorsOsamu FURUHASHI, Tohru KINUGAWA
Estimating the term…
An ion analysis method includes: an ionization step of ionizing a measurement target; an ion input step of inputting target ion, which is an ion obtained in the ionization step or an ion derived from the ion obtained in the ionization step, into a moving space which is adjusted to a predetermined gas pressure of a range allowing particles to perform Brownian motion and in which gravity and an electric field are allowed to act; a measurement step of acquiring, for the target ion input to the moving space, first information relating to a motion by actions of gravity and the electric field and second information relating to Brownian motion; and an arithmetic step of obtaining a mass or a charge of the target ion on the basis of the first information and the second information obtained in the measurement step.
An ion analysis method comprising:
The ion analysis method according to claim 1110, wherein in the ion input step, the ions held in the ion trap are distinguished according to m/z values, and ions remaining after being distinguished are input to the moving space.
An ion analysis method comprising:
An ion analyzer comprising:
An ion analyzer comprising:
Dependencies are inferred from the claim text.