Test pattern forming method, adjustment value determination method, and printing apparatus
AssigneeSeiko Epson Corporation
InventorTetsuya MATSUMURA
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AssigneeSeiko Epson Corporation
InventorTetsuya MATSUMURA
Estimating the term…
A test pattern includes a plurality of patches arranged in a predetermined direction. The plurality of patches include a plurality of first characteristic patches indicating a characteristic of printing first characteristics of a printing apparatus, and further include a plurality of second characteristic patches indicating a second characteristic of the printing characteristics. A test pattern forming method includes a first step of changing a relative positional relationship between a recording head and a medium, and a second step of ejecting a liquid from the recording head such that the test pattern is formed on the medium in which, in the predetermined direction, the first characteristic patches are not adjacent to each other and the second characteristic patches are not adjacent to each other among the plurality of patches.
A test pattern forming method for forming, on a medium, a test pattern for acquiring a printing characteristic of a printing apparatus including a recording head configured to eject a liquid onto the medium,
A printing apparatus comprising:
Dependencies are inferred from the claim text.