X-ray system with modular two-layer detector
AssigneeKoninklijke Philips N.V.
InventorsMARK THOMAS JOHNSON, GEREON VOGTMEIER, THOMAS KOEHLER, SUDIPTA CHAUDHURY, BISWAROOP CHAKRABARTI
Life of this patent
Estimating the term…
Loading patent…
AssigneeKoninklijke Philips N.V.
InventorsMARK THOMAS JOHNSON, GEREON VOGTMEIER, THOMAS KOEHLER, SUDIPTA CHAUDHURY, BISWAROOP CHAKRABARTI
Estimating the term…
The present invention relates to a detection system for an X-ray imaging system. The detection system comprises a first detector a second detector, each detector comprising a detector area and being configured for detecting X-ray radiation emitted by an X-ray source of the X-ray imaging system impinging onto the respective detection area. The detection system is configured to adjust a position of at least one of the first detector and the second detector with respect to the other of the first detector and the second detector. The first detection area of the first detector and the second detection area of the second detector can be positioned at least partially one behind the other with respect to a direction of X-ray radiation emitted from the X-ray source of the X-ray imaging system.
A detection system for an X-ray imaging system, the detection system comprising:
An X-ray imaging system, comprising:
(canceled)
A computer-implemented method for imaging a subject using an X-ray imaging system, comprising:
Dependencies are inferred from the claim text.